• High Performance Scanning Electron Microscopy, Sem
  • High Performance Scanning Electron Microscopy, Sem

High Performance Scanning Electron Microscopy, Sem

Magnification: 20X~150, 000X
Type: Video
Number of Cylinder: Scanning Electron Microscope
Mobility: Desktop
Stereoscopic Effect: Stereoscopic Effect
Kind of Light Source: Ultraviolet
Customization:

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Basic Info.

Model NO.
DJ-SEM150
Shape
Drum-shaped Lens
Usage
Research
Principle
Optics
Principle of Optics
Polarizing Microscope
Product Name
DJ-Sem150 Scanning Electron Microscope
Resolution
5nm (30kv, Se Image)
Acceleration Voltage
1kv to 30kv (1kv/5kv/10kv/15kv/20kv/30kv -6 Step)
Detector
Se Detector, Optional Bse Detector, Eds, etc.
Stage Traverse
5-Axis System or Automatic Control
Image Shift
Image Shift X, Y Image Shift (±150um)
Transport Package
Wooden Case
Specification
460(W)*600(L)*950(H)mm
Trademark
Dr. J Scientific
Origin
Jiangsu Wuxi
HS Code
9011800090
Production Capacity
60

Product Description

General introduction:
The maximum magnification of the DJ-SEM150 series SEM is 150,000 times, and the resolution is up to 5nm (SE, 30kV). It is equipped with SE (secondary electron) detector and BSE (backscattered electron) detector. The load platform can be configured with three axes (X, Y, R). The manual platform can also be upgraded to a five-axis (X, Y, R, Z, T) automatic platform. The EDS spectrum analyzer can be configured in all series of products. The products include the following configurations:
 
Item Model With Detector Option With Stage Option
Mini-SEM DJ-SEM150 DJ-SEM150S DJ-SEM150S-MS
DJ-SEM150D DJ-SEM150D-MS
DJ-SEM150D-ST
High Performance Scanning Electron Microscopy, Sem
 
Description:
(1) Max Magnification 150,000x
(2) Signal Detection: SE Detector + BSE Detector
(3) Accelerating Voltage:1kV to 30kV, High image resolution, High image resolution;
(4) Equipped with 4 iris diaphragms (30, 50, 50, 100μm), which can provide high-resolution images by changing the size of the electron beam;
(5) EDS is optional, for component analysis
(6) CCD sample navigation is optional
(7) Tilt Stage configuration (0~90°) (optional)

Specifications:
Resolution 5nm (30kV,SE)
Magnification 20x~150,000x
Accelerating Voltage 1~30kV
Detector SE Detector, Optional BSE detector, EDS, etc.
Electron Gun Pre centered tungsten filament cartridge
Lens system Focus Lens:2-stage Electromagnetic Condenser Lens
Objective Lens: 1-stage Electromagnetic Objective Lens
Stage 3 axis System, X, Y-axis : 35mm / R-axis: 360°
Optional 5-axis sample stage: X:40mm, Y:40mm, Z:40mm, R:360°, T:0~90°
Image shift Image shift X, Y Image Shift (±150um)
Iris Diaphragms Adjustable iris diaphragms(30/50/50/100μm)
Max Sample size 80mm in diameter, 35mm in height
Image Scanning system Fast Scan:320*240   Slow Scan: 640*480
Photo Mode 1:1280*960    Photo Mode 2:2560*1920   Photo Mode 3:5120*3840
Automatic Function Auto start,Auto focus,Auto Brightness/Contrast
Image format BMP, JPEG, PNG, TIFF
Image Data display Magnification,Detector type,Accelerating Voltage,Vacuum mode,Logo(Text),Date and time,Text marker,scale bar
Vacuum system High vacuum mode, mechanical pump, molecular pump, vacuuming time: within 3 minutes
Device Volume 460(W)*600(L)*950(H)mm
Equipment environment Temperature:15ºC~30ºC , Humidity:70% or less
Power source:Single phase 100~240V AC, 1KW, 50/60Hz


Packing & Shipping
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem
High Performance Scanning Electron Microscopy, Sem


 

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